Interesting links on SPM

  • Asylum Research: Technology leader company for scanning probe and atomic force microscopes (SPM/AFM) for both materials and bioscience applications.
  • Nanoscience: Supplier for nanotechnology and nanoscience related instruments and parts.


1] G. Binning, H. Rohrer, C. Gerber, and E. Weibel, “Surface studies by scanning tunneling microscopy,” Phys. Rev. Lett., vol. 49, no. 1, pp. 57–61, Jul 1982.

[2] Interface physics group, westfälische wilhelms-universität. sxm proyect: Scanning tunneling microscope, construction kit. [Online]. Available:

[3] R. B. Montoya, Fabricación de nanoestructuras usando un microscopio de efecto túnel: Una primera exploración. Tesis de Grado. Universidad de los Andes, Jun 2007.

[4] N. AG, NanoGrid 160: T, Nanosurfo Sample. Nanosurf AG, Switzerland - BT01172, 2004.

[5] D. J. Paul, “El futuro de la microelectrónica.” Design Engineering, p. 12, May 2000.

[6] I. Corp. Intel museum - mooreŠs law documents. [Online]. Available: com/museum/archives/historydocs/mooreslaw.htm

[7] G. Binnig and H. Rohrer, “Scanning tunneling microscopy—from birth to adolescence,” Rev. Mod. Phys., vol. 59, no. 3, pp. 615–625, Jul 1987.

[8] G. Binnig, H. Rohrer, C. Gerber, and E. Weibel, “7 x 7 reconstruction on si(111) resolved in real space,” Phys. Rev. Lett., vol. 50, no. 2, pp. 120–123, Jan 1983.

[9] J. P. V. G. Doyen, E. Koetter and M. Scheffler, “Theory of scanning tunneling microscopy,” Applied Physics A: Materials Science & Processing, vol. 51, pp. 281–288, oct 1990. [Online]. Available:

[10] F. Ruess, L. Oberbeck, M. Simmons, K. Goh, A. Hamilton, T. Hallam, S. Schofield, N. Curson, and R. Clark, “Toward atomic-scale device fabrication in silicon using scanning probe microscopy,” Nano Letters, vol. 4, no. 10, pp. 1969–1973, 2004. [Online]. Available:

[11] A. F. Sarmiento, Implementación de un microscopio de efecto túnel (STM). Tesis de Grado. Universidad de los Andes, 2007.

[12] J. Tersoff and D. R. Hamann, “Theory of the scanning tunneling microscope,” Phys. Rev. B, vol. 31, no. 2, pp. 805–813, Jan 1985.

[13] J. Tersoff and N. D. Lang, “Theory of scanning tunneling microscope,” in Scanning Tunneling Microscope, J. A. Stroscio and W. J. Kaiser, Eds., vol. 27. Academic Press Inc., 1993.

[14] F. A. Bonilla, “Asylum research: Report of vibration data ml building,” Carpeta de Documentación: STM-Uniandes, Documento interno, jan 2007.

[15] A. I. Oliva, V. Sosa, R. de Coss, R. Sosa, N. Lopez Salazar, and J. L. Pena, “Vibration isolation analysis for a scanning tunneling microscope,” Review of Scientific Instruments, vol. 63, pp. 3326–3329, June 1992.

[16] D. W. Pohl, “Some design criteria in scanning tunneling microscopy,” IBM Journal of Research and Development, vol. 30, no. 4, pp. 417–427, 1986.

[17] A. I. Oliva, V. Sosa, R. de Coss, R. Sosa, N. López Salazar, and J. L. Peña, “Vibration isolation analysis for a scanning tunneling microscope,” Review of Scientific Instruments, vol. 63, pp. 3326–3329, June 1992.

[18] T. Williams, The Circuit DesignerŠs Companion. Great Britain: Elsevier, Jun 2005.

[19] J. Buxton. Application note an-257: Careful design tames high-speed op amps. [Online]. Available:

[20] R. B. Montoya, Work report on Schul-AFM. Interface Physics Group, Westfälische Wilhelms-Universität., Apr 2008.

[21] A. J. Melmed, “The art and science and other aspects of making sharp tips,” Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, vol. 9, no. 2, pp. 601–608, Mar. 1991.

[22] J. P. Ibe, P. P. Bey, Jr., S. L. Brandow, R. A. Brizzolara, N. A. Burnham, D. P. Dilella, K. P. Lee, C. R. K. Marrian, and R. J. Colton, “On the electrochemical etching of tips for scanning tunneling microscopy,” Journal of Vacuum Science Technology, vol. 8, pp. 3570–3575, July 1990.

[23] B. L. Rogers, J. G. Shapter, W. M. Skinner, and K. Gascoigne, “A method for production of cheap, reliable pt–ir tips,” Review of Scientific Instruments, vol. 71, no. 4, pp. 1702–1705, 2000. [Online]. Available:

[24] P. . D. L. P. GmbH. Low voltage co-fired multilayer stacks, rings and chips for actuation. [Online]. Available:

[25] T. R. Albrecht, M. M. Dovek, M. D. Kirk, C. A. Lang, C. F. Quate, and D. P. E. Smith, “Nanometer-scale hole formation on graphite using a scanning tunneling microscope,” Applied Physics Letters, vol. 55, pp. 1727–1729, Oct. 1989.

[26] S. A. H. Robin L. McCarley and A. J. Bard, “Controlled nanofabrication of highly oriented pyrolytic graphite with the scanning tunneling microscope,” J. Phys. Chem., vol. 96, no. 25, pp. 10 089 – 10 092, jan 1992.

[27] P. R. G M Shedd, “The scanning tunneling microscope as a tool for nanofabrication,” Nanotechnology, vol. 1, no. 1, pp. 67–80, 1990.

[28] G. Binnig, et al., "Atomic Force Microscope," Physical Review Letters, vol. 56, p. 930, 1986.

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