Centro de Microelectrónica Universidad de los Andes -

Publications on Scanning Probe Microscopy by CMUA

• Electrical Measurement Techniques in Atomic Force Microscopy. Avila, Alba; Bhushan, Bharat. Critical Reviews in Solid State and Materials Sciences, vol. 35, issue 1, pp. 38-51.
• A study of surfaces using a scanning tunneling microscope (STM). AVILA BERNAL, Alba Graciela and BONILLA OSORIO, Ruy Sebastián. Ing. Investig., Sept./Dec. 2009, vol.29, no.3, p.121-127. ISSN 0120-5609.

Publications on Tip Preparation by CMUA

• Reproducible Fabrication of Scanning Tunneling Microscope Tips. BERNAL, Rodrigo and AVILA, Alba. rev.ing., Jan./June 2008, no.27, p.43-48. ISSN 0121-4993.
• Fabricación reproducible de puntas para Microscopios de Punta de Tunelamiento. BERNAL, Rodrigo and AVILA, Alba. Revista Ingenio. Universidad San Buenaventura.

• Surface charge estimation on hemispherical dielectric samples from EFM force gradient measurements. A. Gomez, A. Avilaa, and Juan P. Hinestroza. Journal of Electrostatics Volume 68, Issue 1, February 2010, Pages 79-84.
• Electrostatic tip-dielectric sample interaction in electrostatic force microscopy. GOMEZ, Ariel, AVILA, Alba Graciela and MASSY, Gergory Ibrahim. Rev.fac.ing.univ. Antioquia, Oct./Dec. 2009, no.50, p.31-40. ISSN 0120-6230

• Educational Scanning Probe Microscopy (Talk at the IEEE event -Universidad Santo Tomás, Colombia)
• Detección de Nanoestructuras con el AFM Basado en Diapasón de Cuarzo (IBERCHIP 2009)